WDS is an alternative technique for the elemental analysis and mapping of samples that provides an enhanced spectral resolution and signal-to-noise ratio. Find out more about the theory and uses of WDS here!

WDS is a technique complementary to EDS for performing X-ray analysis of materials. The goal is the same as with EDS, to determine elemental composition of the sample, and it is used for the same purpose; so you might ask yourself, do we then need WDS?

dispersive and wavelength dispersive spectrometers (EDS and WDS) are available on the microprobes for qualitative and quantitative analysis. The beam can be rastered over the sample to produce images in the magnification range of 40-360,000X. X-ray elemental maps are obtained by using the emitted X-rays as the signal source instead of BE or SE.

Element mapping by WDS on the electron microprobe is usually performed by using a fixed electron beam (“spot” mode) in combination with specimen stage scanning motion, an ap-proach referred to as “stage mapping.”

This tutorial explains how to successfully acquire elemental maps using a combination of Wavelength Dispersive Spectrometry (WDS / WDX) and EDS on an SEM with AZtecWave.

AZtecWave combines the high spectral resolution of the Wave Spectrometer, to resolve X-ray peaks and quantify minor and trace elements, with the speed and flexibility of EDS. This delivers an advanced and complete solution for compositional analysis on the SEM.

May 17, 2007 · WDS is used for non-destructive quantitative analyses of spots as small as a few micrometers, at detection levels as low as a few 10s of ppmw, and for elements from atomic number 5 (boron) and higher.

WDS was the original technique developed to precisely and accurately determine chemical compositions of microvolumes (a few cubic microns) of "thick" specimens, and the instrument used is the electron microprobe.

The resulting map will show the X-ray counts at each pixel mapped, and can easily be calibrated to show mass percentages. Applications range from identifying and understanding compositional variations in natural and synthetic crystals to monitoring and quantifying corrosion products to evaluating deposited thin film uniformity.

Combining energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry (WDS) on a scanning electron microscope (SEM) provides a powerful and flexible tool for investigating spatial compositional variations in solid samples. EDS is highly sensitive and can quickly generate element maps over large sample areas.