Figure 1: CAD solution for IC design and debug Design Yield – Local Dispersion The other well-known lack of Monte Carlo analysis is the very long simulation time required to perform a thorough ...
Fig.2. Failure analysis methodologies used in IC development (a) (b) [1] JCH Phang, DSH Chan, M. Palaniappan, JM Chin, B. Davis, M Bruce, “A review of Laser Induced Techniques for Microelectronic ...
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